S. O. Hruszkewycz: h-index, Total Citations, and Citation Map
S. O. Hruszkewycz's h-index is 26 (51 i10-index, 2,257+ total citations across 115+ publications) according to Google Scholar as of May 2026. S. O. Hruszkewycz is affiliated with Materials Science Department, Argonne National Laboratory.
S. O. Hruszkewycz is a researcher affiliated with Materials Science Department, Argonne National Laboratory, specializing in Materials Science, X-ray Science. Their work has been cited 2,257 times. This profile visualizes their global influence, highlighting strong citation networks in United States.
S. O. Hruszkewycz's Citation Metrics
Bibliometric impact based on 115 indexed publications. Of these, 15 are original research articles — the rest are literature highlights, conference abstracts or theses.
- H-Index
- 26
- i10-Index
- 51
- Total Citations
- 2,257
- Citing Countries
- 42
As of May 2026.
S. O. Hruszkewycz has an h-index of 26 and 2,257 total citations across 115 publications, with research cited by institutions in 42 countries.
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Global Impact Map
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Top Cited Works
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High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography
2017150
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Visa Evidence Package
Views and exports tuned for EB-1A, O-1A, and EB-2 NIW petitions. Sustained acclaim, geographic reach, and independent-citation filtering are the strongest evidence categories immigration adjudicators look for.
Significant Contributions
Auto-detected research lines — a seminal paper and the follow-up work building on it. Review and edit before using in a petition. Each Free PDF opens in a new tab — EB-1A organises this into the structure USCIS applies to Criterion 5 of 8 CFR § 204.5(h)(3)(v); EB-1B re-frames it under § 204.5(i)(3) (outstanding researcher); NIW presents it under prong 2 of Matter of Dhanasar.
894 citing papers could not be classified (no author data) — excluded from the percentages above.
The researcher pioneered nanofocused X-ray Bragg projection ptychography for quantitative nanoscale imaging of lattice distortions and 3D structural defects in semiconductor heterostructures.
The researcher pioneered high-contrast X-ray speckle analysis for atomic-scale order in liquids and glasses, extending these methods to ultrafast dynamics and free-electron laser coherence characterization.
The researcher pioneered 3D imaging of dislocation dynamics during hydriding phase transformations, establishing a foundational methodology that subsequent work extended to adaptive phase retrieval and sub-pixel high-resolution x-ray imaging.
Citation trend (last 10 years)Click to expand
Citation Trend (Last 10 Years)
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