Peter Nellist: h-index, Total Citations, and Citation Map
Peter Nellist's h-index is 65 (153 i10-index, 24,078+ total citations across 470+ publications) according to Google Scholar as of June 2026. Peter Nellist is affiliated with Professor of Materials, University of Oxford.
Peter Nellist is a researcher affiliated with Professor of Materials, University of Oxford, specializing in Electron microscopy. Their work has been cited 24,078 times. This profile visualizes their global influence, highlighting strong citation networks in China.
Peter Nellist's Citation Metrics
Bibliometric impact based on 470 indexed publications.
- H-Index
- 65
- i10-Index
- 153
- Total Citations
- 24,078
- Citing Countries
- 13
As of June 2026.
Peter Nellist has an h-index of 65 and 24,078 total citations across 470 publications, with research cited by institutions in 13 countries.
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Two-dimensional nanosheets produced by liquid exfoliation of layered materials
20118,611
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Citation trend (last 10 years)Click to expand
Citation Trend (Last 10 Years)
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About Peter Nellist's research
Peter Nellist is a researcher in Electron microscopy at Professor of Materials, University of Oxford. Their work has been cited 24,078 times across 470 publications (h-index 65), according to Google Scholar.
Their most-cited work, “Two-dimensional nanosheets produced by liquid exfoliation of layered materials” (2011), has accumulated 8,611 citations. Other influential works include “Scanning transmission electron microscopy: imaging and analysis” (2011) with 1,117 citations and “Direct sub-angstrom imaging of a crystal lattice” (2004) with 736 citations.
Citations of Peter Nellist's research come primarily from China, United States and Canada, reflecting international research impact across 5+ countries. The interactive citation map above shows the full geographic distribution of the institutions citing this work.
